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Speckle contrast for flat-topped field profiles

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dc.contributor.author Baykal, Yahya
dc.date.accessioned 2017-02-23T11:45:14Z
dc.date.available 2017-02-23T11:45:14Z
dc.date.issued 2013-02
dc.identifier.citation Baykal, Y. (2013). Speckle contrast for flat-topped field profiles. Optics and Laser Technology, 45, 593-597. http://dx.doi.org/10.1016/j.optlastec.2012.05.026 tr_TR
dc.identifier.issn 0030-3992
dc.identifier.uri http://hdl.handle.net/20.500.12416/1306
dc.description.abstract Speckle contrast is evaluated for flat-topped field profiles where the characterization and evaluation of speckle contrast are based on mathematical formulation and theoretical parameter variation. The speckle field which is represented by the random phase shift and the random phase tilt is multiplied by the flat-topped shaped field. The increase in the source size of the flat-topped field first causes the speckle contrast to increase, then reaches saturation. Increase in the variance of the phase shift of a flat-topped field causes an appreciable increase in the speckle contrast. Depending on the diffraction characteristics of the finite sized flat-topped field distribution, upon changing the variance of the phase shift, the speckle contrast exhibits different behavior at short and long propagation distances. However, especially for small variances of phase tilts, the speckle contrast seems to monotonically increase as the propagation distance becomes larger. The effect of the order of flatness on the speckle contrast is small at short propagation distances which can be appreciable at long propagation distances tr_TR
dc.language.iso eng tr_TR
dc.publisher Elsevier Science Ltd tr_TR
dc.relation.isversionof 10.1016/j.optlastec.2012.05.026 tr_TR
dc.rights info:eu-repo/semantics/closedAccess
dc.subject Speckle Contrast tr_TR
dc.subject Flat-Topped Field Profile tr_TR
dc.subject Speckle Propagation tr_TR
dc.title Speckle contrast for flat-topped field profiles tr_TR
dc.type article tr_TR
dc.relation.journal Optics and Laser Technology tr_TR
dc.contributor.authorID 7812 tr_TR
dc.identifier.volume 45 tr_TR
dc.identifier.startpage 593 tr_TR
dc.identifier.endpage 597 tr_TR
dc.contributor.department Çankaya Üniversitesi, Mühendislik Fakültesi, Elektronik ve Haberleşme Mühendisliği tr_TR


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