dc.contributor.author |
Kavak, Halil
|
|
dc.contributor.author |
İskender, İres
|
|
dc.contributor.author |
Jahi, Amir
|
|
dc.date.accessioned |
2024-03-01T07:04:04Z |
|
dc.date.available |
2024-03-01T07:04:04Z |
|
dc.date.issued |
2018 |
|
dc.identifier.citation |
Kavak, H.; İskender, İ.; Jahi, A. (2018). "Conducted Emi Performance Comparison Of Si And Sic Mosfets In A Ccm Boost Pfc Converter For MIL-STD-461F CE102", Poznan University Of Technology Academic Journals. |
tr_TR |
dc.identifier.uri |
http://hdl.handle.net/20.500.12416/7407 |
|
dc.description.abstract |
This paper presents a comparison of conducted EMI performance of Si and SiC
MOSFETs in a CCM PFC boost converter that is designed to meet CE102 of MIL-STD461F. EMI performance comparison is based on MOSFET of the PFC converter. That is,
the power switch of the converter is the only parameter that is changed during tests. The
boost diode is kept the same during the tests and the type of the boost diode is SiC. The
paper shows the CE102 test results of Si and SiC MOSFETs without an EMI filter at the
input side of CCM PFC boost converter. |
tr_TR |
dc.language.iso |
eng |
tr_TR |
dc.relation.isversionof |
10.21008/j.1897-0737.2018.95.0009 |
tr_TR |
dc.rights |
info:eu-repo/semantics/openAccess |
tr_TR |
dc.subject |
CCM Boost Converter |
tr_TR |
dc.subject |
Silicon |
tr_TR |
dc.subject |
Silicon Carbide |
tr_TR |
dc.subject |
Conducted EMI, CE102. |
tr_TR |
dc.title |
Conducted Emi Performance Comparison Of Si And Sic Mosfets In A Ccm Boost Pfc Converter For MIL-STD-461F CE102 |
tr_TR |
dc.type |
article |
tr_TR |
dc.relation.journal |
Poznan University Of Technology Academic Journals |
tr_TR |
dc.contributor.authorID |
133746 |
tr_TR |
dc.contributor.department |
Çankaya Üniversitesi, Mühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümü |
tr_TR |